The Thermo Scientific Helios 5 Plasma FIB (PFIB) DualBeam (focused ion beam scanning electron microscope, or FIB-SEM) delivers unmatched capabilities for materials science as well as semiconductor applications. The Helios 5 PFIB DualBeam provides large-volume 3D characterization, gallium-free sample preparation, and precise micromachining for materials science researchers. Moreover, it delivers damage-free, large-area de-processing, fast sample preparation, and high-fidelity failure analysis for manufacturers of semiconductor devices, advanced packaging technology as well as display devices.
Useful link’s:
Specifikacija: Helios 5 PFIB CXe DualBeam (materials science research)
Specifikacija: Helios 5 PFIB UXe DualBeam (materials science research)
Specifikacija: Helios 5 PFIB CXe DualBeam (semiconductor analysis)
Specifikacija: Helios 5 PFIB UXe DualBeam (semiconductor analysis)
Specifikacija: Helios 5 PFIB HXe DualBeam (semiconductor analysis)
