DualBeam Instruments

DualBeam - focused ion beam scanning electron microscopy (FIB-SEM) instruments generate structural and compositional information at the nanoscale, by combining the precise sample modification of FIB with the high-resolution imaging of SEM. This technique opens up the possibility for scientists and engineers in both academia and industry to face constant challenges that require localized characterization of a wide range of samples and materials and moreover to improve the quality of targeted materials. Being the industry leader in FIB-SEM technology, with more than 25 years of experience with DualBeam instrumentation, Thermo Fisher Scientific offers a broad product portfolio and advanced automation capabilities for a range of applications: transmission electron microscopy (TEM) sample preparation, subsurface and 3D characterization, nano-prototyping, in situ experimentation and more.