Scios 2 DualBeam
The Thermo Scientific Scios 2 DualBeam is an ultra-high-resolution analytical focused ion beam scanning electron microscopy (FIB-SEM) system, which provides outstanding sample preparation and 3D characterization performance for...
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Aquilos 2 Cryo FIB
The Aquilos 2 Cryo-FIB is the latest generation of Thermo Scientific's cryo-DualBeam system, which is dedicated to the preparation of thin, electron-transparent lamellas for high-resolution cryo-electron tomography or MicroED o...
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Helios 5 Hydra DualBeam
The Thermo Scientific Helios 5 Hydra DualBeam is a plasma focused ion beam scanning electron microscope (PFIB-SEM) that can deliver four different ion species as the primary beam, allowing you to choose the ions that provide th...
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Helios 5 laser PFIB System
The Thermo Scientific Helios 5 Laser PFIB System combines the best-in-class monochromated Elstar Scanning Electron Microscopy (SEM) Column with a plasma focused ion beam (PFIB) as well as a femtosecond laser. Consequently, it ...
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Helios G4 PFIB DualBeam
The Thermo Scientific Helios G4 Plasma FIB (PFIB) DualBeam (focused ion beam scanning electron microscope, or FIB-SEM) is part of the fourth generation of the industry-leading Helios DualBeam family. It delivers unmatched capab...
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Helios 5 PFIB DualBeam
The Thermo Scientific Helios 5 Plasma FIB (PFIB) DualBeam (focused ion beam scanning electron microscope, or FIB-SEM) delivers unmatched capabilities for materials science as well as semiconductor applications. The Helios 5 PFI...
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Helios 5 DualBeam
The Thermo Scientific Helios 5 DualBeam is part of the fifth generation of the industry-leading Helios DualBeam family. Combining the innovative Elstar electron column for extreme high-resolution imaging and the high materials ...
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Helios 5 EXL DualBeam
The Thermo Scientific Helios 5 EXL DualBeam is a 300mm full-wafer focused ion beam scanning electron microscope (FIB-SEM), which was designed to address TEM sample preparation challenges in the semiconductor industry. The Helio...
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ExSolve WTP DualBeam
The Thermo Scientific ExSolve wafer TEM prep (WTP) DualBeam (FIB-SEM) dramatically reduces the cost and increases the speed of sample preparation, thus providing semiconductor and data storage manufacturers with a quick and eas...
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