The Thermo Scientific Helios G4 Plasma FIB (PFIB) DualBeam (focused ion beam scanning electron microscope, or FIB-SEM) is part of the fourth generation of the industry-leading Helios DualBeam family. It delivers unmatched capabilities for large-volume 3D characterization, gallium-free sample preparation, semiconductor planar deprocessing, as well as precise micromachining. The Helios G4 PFIB DualBeam combines a PFIB column and the Thermo Scientific Monochromated Elstar SEM Column in order to deliver advanced focused-ion- and electron-beam performance. Intuitive software, an unprecedented level of automation and ease-of-use enable the users to observe and analyze relevant subsurface volumes.
Useful link’s:
Specifikacija: Helios G4 PFIB UXe DualBeam for Materials Science
Specifikacija: Helios G4 PFIB CXe DualBeam for Materials Science
Specifikacija: Helios G4 PFIB UXe DualBeam for Semiconductors
