The Thermo Scientific Lumis Electron Backscatter Diffraction (EBSD) detector incorporates new CMOS sensor technology and advanced optics, which is harnessed with Thermo Scientific Pathfinder 2.0 microanalysis software that includes new indexing algorithms for the analysis of electron backscatter patterns (EBSPs). Quickly identify crystallographic phases, grain sizes and orientation, and monitor structural transformations in scanning electron microscope (SEM) samples with EBSD technology, designed for maximum throughput and high resolution.
