Delivering purity at the microscale, the Thermo Scientific Phenom ParticleX Desktop Scanning Electron Microscope (SEM) is a multi-purpose desktop SEM designed for additive manufacturing. It enables monitoring critical characteristics of metal powders, identifying particle size distributions, individual particle morphology as well as foreign particles. The Phenom ParticleX AM Desktop SEM is equipped with a chamber that allows the analysis of large samples, up to 100 mm x 100 mm. A proprietary venting/loading mechanism ensures the fastest vent/load cycle in the world, thus providing the highest throughput.
