The Thermo Scientific Scios 2 DualBeam is an ultra-high-resolution analytical focused ion beam scanning electron microscopy (FIB-SEM) system, which provides outstanding sample preparation and 3D characterization performance for a broad range of samples, including magnetic and non-conductive materials. With innovative features that were designed to increase throughput, precision and ease of use, the Scios 2 DualBeam is an ideal solution for scientists and engineers in advanced research and analysis – accross academic, governmental, as well as industrial research environments.
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Specifikacija: μPolisher
