The Thermo Scientific™ Helios 5™ EXL DualBeam is a 300mm full-wafer focused ion beam scanning electron microscope (FIB-SEM), which was designed to address TEM sample preparation challenges in the semiconductor industry. The Thermo Scientific™ Helios 5™ EXL DualBeam has the ability to prepare samples for today’s most advanced process nodes, including sub-5nm and gate-all-around technology.
