The Thermo Scientific ELITE System uses high resolution Lock-in IR Thermography (LIT) with the highest sensitivity in order to accurately and efficiently localize defects in semiconductor devices. It provides a critical solution for through package, on-die or even on-board electrical defect localization for the widest range of defect types: power or line shorts, ESD defects, defective transistors and diodes, current leakage, oxide damage, device latch-up, resistive opens and more.
