Electron microscopy

Electron microscopes use a beam of accelerated electrons to generate an image, with the electrons having a significantly shorter wavelength than visible and UV light used in optical light microscopes. The very nature of the electron allows for higher magnification and better resolution. Electron microscopes are divided into two categories, transmission electron microscopes (TEM) and scanning electron microscopes (SEM). With their powerful resolution and the possibility of magnification, they have found application in material characterization, semiconductor production, biological and medical research. Scanning electron microscopes (SEM) enable the most diverse examination and analysis of the microstructural characteristics of solid objects. With SEM we can capture a high resolution image for a large volume sample. An important feature of SEM is the depth of the image, which gives us a three-dimensional appearance of the sample. Thanks to the ability to observe and characterize heterogeneous organic and inorganic materials on the micrometer and nanometer scale, SEM has become a key instrument in numerous research areas, covering everything from materials science, through forensics, industrial production, to biological and medical research. Transmission electron microscopy (TEM) is a technique of capturing a high-resolution image in which a beam of electrons passes through a thin sample to generate an image. The electron beam is affected by the thickness and density of the sample, its composition and in some cases the crystallinity. The transmission electron microscope (TEM) is an ideal tool for analyzing the composition and structure of the atomic scale. It gives us images of samples and their defects in atomic resolution, together with spectroscopic data and diffraction patterns for sub-nanometer regions. TEM is an indispensable instrument in materials science, and with the development of cryo-TEM, it is increasingly represented in biological and medical research.

Scanning Electron Microscopy (SEM)

Since the introduction of electron microscopes in the 1930s, scanning electron microscopy (SEM) has developed into a critical tool within numerous different research fields, spanning areas from materials science, to forensics, to industr...

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Desktop Scanning Electron Microscopy (Desktop SEM)

Since the introduction of electron microscopes in the 1930s, scanning electron microscopy (SEM) has developed into a critical tool within numerous different research fields, spanning areas from materials science, to forensics, to industr...

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Transmission electron microscopy (TEM)

Transmission electron microscopy (TEM) is a high-resolution imaging technique in which an image is produced when a beam of electrons passes through a thin sample. The electron beam is impacted by the thickness/density of a sample, its co...

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DualBeam Instruments

DualBeam - focused ion beam scanning electron microscopy (FIB-SEM) instruments generate structural and compositional information at the nanoscale, by combining the precise sample modification of FIB with the high-resolution imaging of SE...

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Electrical Failure Analysis (EFA) Systems

Shrinking technologies, new materials, and more complex structures are making defects increasingly common - especially when the circuit design is particularly sensitive to process variation. These non-visual defects reveal themselves as ...

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Circuit Edit Systems

Circuit edit technology enables fast prototyping of small design corrections at multiple points of the IC manufacturing process: after first silicon debug, for performance enhancements during yield ramp, to create a small number of funct...

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Micro-computed tomography (microCT)

Having the ability to efficiently produce quantitative 3D images of nearly any sample, micro-computed tomography (microCT) has become a standard tool for materials science research. As the reconstructions are generated with non-destructi...

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Sample Vitrification in Electron Microscopy

Vitrification forms an amorphous solid that does little to no damage to the sample structure. This is a critical technique for cellular and structural biology research, where samples are cooled so rapidly that the surrounding water molec...

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Detectors for Electron Microscopy

Thermo Scientific Pathfinder X-ray microanalysis for SEM/EDS and SEM/WDS prevents many of the difficulties found in traditional elemental-based X-ray microanalysis. Pathfinder software classifies the chemical phases in your sample straig...

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Electron Microscopy Applications

Electron Microscopes (EM) use a beam of accelerated electrons in order to generate an image, the electrons used having a shorter wavelength than that of visible or UV light used in optical light microscopes. The very nature of ...
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