We are pleased to announce that Analysis d.o.o. has become an authorized distributor of FEI Europe B.V., for the territory of Serbia, Montenegro, Macedonia, BiH and Albania. FEI is a renowned manufacturer of:
- SEM – scanning electron microscopes used to examine the material topography with resolutions down to the sub-nanometer range.
- TEM – transmission electron microscopes, the market-leading products, that have a fully integrated and automated operating procedure for a wide range of applications requiring ultra high resolution images at the angstrom scale.
- Focused ion beam (FIB) systems – which detect surface defects in materials and devices. These systems have a high degree of analogy with focused electron beam systems, such as SEM.
- DualBeam (FIB / SEM) systems are an excellent choice for 3D microscopy, material characterization, failure analysis in industrial production and process control applications.