The nProber IV System is a high-performance scanning-electron-microscopy-based platform designed for the localization of transistor and metallization faults. It is Thermo Scientific’s most advanced nanoprobing system to date, and the first one to use the high-resolution LEEN2 SEM Column. The nProber IV is specifically constructed to increase the speed, accuracy, and output of your failure analysis (FA) workflow, where productivity is of supreme importance.
