Delivering purity at the microscale, the Thermo Scientific™ Phenom™ ParticleX Desktop Scanning Electron Microscope (SEM) is a multi-purpose desktop SEM designed for additive manufacturing. It enables monitoring critical characteristics of metal powders, identifying particle size distributions, individual particle morphology as well as foreign particles. The Thermo Scientific™ Phenom™ ParticleX AM Desktop SEM is equipped with a chamber that allows the analysis of large samples, up to 100 mm x 100 mm. A proprietary venting/loading mechanism ensures the fastest vent/load cycle in the world, thus providing the highest throughput.