The new Thermo Scientific Spectra Ultra Scanning Transmission Electron Microscope (S/TEM) makes the accelerating voltage an adjustable parameter, just like probe current. What is more, its massive Ultra-X EDX system enables chemical characterization of materials that are too beam-sensitive for conventional EDX analysis. The Spectra Ultra aberration-corrected S/TEM provides an industry leading level of characterization capabilities for materials science and semiconductor applications – at the highest resolution on a wide variety of samples.
Specification – Spectra Ultra S/TEM for Materials Science
Specifikacija – Spectra Ultra S/TEM for Semiconductors